Metrology, Standardization and Certification

Major: Micro and Nanosystems of the Internet of Things
Code of subject: 6.153.03.O.012
Credits: 6.00
Department: Semiconductor Electronics
Lecturer: Logush Oleg Ilariyovych, senior lecturer
Semester: 2 семестр
Mode of study: денна
Мета вивчення дисципліни: The purpose of studying an academic discipline is to share with students the knowledge of the basics of the structure and principles of operation of measuring equipment, study and application methods of measuring physical quantities, which are later encountered during the study of special disciplines, assessment of measurement accuracy, reliability of obtained results, processing and presentation of the obtained results, metrological certification of measuring devices, familiarization with the state standardization system of Ukraine. The course material  is necessary for practical activities of both a student, when mastering future courses, and a bachelor pursuing the degree of Micro and nanosystem engineering.
Завдання: Task: Formation and development of competences: Integral: Ability to solve specialized tasks and practical problems during professional activities in the field of automation and instrumentation and in the learning process that involves application theories and methods used in micro and nanosystem engineering. General: Ability to apply the acquired knowledge in practical activities. Knowledge and comprehension of the subject area and understanding of professional activity. Ability to learn and master modern knowledge. Ability to search, process and analyze information from various sources. Ability to conduct research at the appropriate level. Abstract thinking ability, analysis and synthesis. Human interaction skills and teamwork. Ability to evaluate and ensure the quality of work performed. Professional: Ability to apply appropriate scientific and engineering methods, modern information technologies and computer software, computer networks, databases and Internet resources for solving professional problems in the field of micro and nanosystem technology. Ability to develop assessment methods of the materials quality of micro and nanosystem technology, methods of testing devices, systems of metrological verification.
Learning outcomes: According to the curriculum, as a result of studying the academic discipline a student  must demonstrate the following learning achievement: be able to apply the knowledge of the devices operation principles and systems of micro and nano-system equipment in their operation design and operation. To know and understand the physical and chemical laws and phenomena underlying the technological processes of the course, to have knowledge of methods and means of controlling their parameters. To study the characteristics of technological processes, parameters of materials and devices of micro and nanosystem technology, taking into account the research goals, requirements and specifics of the selected technical means. Skills in using information and communication technologies to process measurement results.
Required prior and related subjects: Prerequisites: – Higher mathematics part 1, 2, 3; – Physics part 1, 2, 3; – Engineering programming.
Summary of the subject: The educational discipline covers the most common methods and means of measurement in the field of micro and nanosystem technology, studying the structure and principle of operation of measuring devices, processing and presenting the obtained results, achieving the required accuracy, the basics of standardization, certification and quality improvement .
Опис: Description of the academic discipline (topics). 1. Introduction. The purpose and objectives of the course. The role and place of the discipline in the curriculum of the major Micro and nanosystem engineering. Basic concepts and definitions. 2. Terminology and standardization of methods and means of measurement. Systems of units of physical quantities, standards of units. Sample measures, working measures, measuring converters. Metrology Service of Ukraine. State metrological control and supervision. 3. Metrological characteristics of measuring instruments, standardization of metrological characteristics. Dynamic characteristics of measuring devices. 4. Elements of the theory of errors. Errors of direct and indirect measurements. Rules for rounding error values and measurement results. Series of dominant numbers. Methods of processing measurement results and assessing the reliability and accuracy of the experiment. 5. Analog devices and devices for measuring electric and magnetic quantities. Classification, structure, principle of action, metrological characteristics, use features. Causes of measurement errors, systematic and random error components. Bridges and compensators. 6. Methods and means of measuring non-electric quantities. Temperature measurements and their metrological support. The specificity of the methods of determining costs in technological processes of electronics, their classification, accuracy and features of use. Metrological support of mass measurement. Measurement of the content of suspended particles in the air. Measuring the dimensions of elements of electronic devices. The specifics of determining dimensions in the range of 10 -9 – 10 -10 m. Methods and means of measuring energy, spectral, polarization and coherence characteristics of optical radiation sources. 7. Standardization in electronics. International and domestic standardization bodies and services. State standardization system of Ukraine.
Assessment methods and criteria: The level of knowledge of a higher education student is based on the results of examination and ongoing assessment. Theoretical questions and tasks requiring the ability to apply the acquired knowledge to determine the properties and characteristics of technological processes, materials and products of micro and nanosystems techniques. Current assessment is carried out by the method of frontal testing of knowledge during lectures and practical classes and the quality of laboratory work.
Критерії оцінювання результатів навчання: current assessment (written reports on laboratory work, oral survey), 30%; - exam (written and oral form), 70%.
Recommended books: 1. Dorozhovets M., Motalo V., Stadnyk B. and others. Basics of metrology and measuring technology. In 2 volumes. – Lviv: Lviv Polytechnic University Publishing House. - 2005. V.1 - 532p. V.2 - 656 p. 2. Bychkivskyi R.V., Stolyarchuk P.G., Gamula P.R. Metrology, standardization, quality management and certification: — Lviv: Publishing House of the National University of Lviv Polytechnic, 2002. – 560 p.