Metrology, Standardization and Certification

Major: Micro and Nanosystem Technology
Code of subject: 6.153.03.O.12
Credits: 6.00
Department: Semiconductor Electronics
Lecturer: Logush Oleg Ilariyovych, senior lecturer
Semester: 2 семестр
Mode of study: денна
Learning outcomes: Learning outcomes: According to the curriculum, as a result of studying the academic discipline a student must demonstrate the following learning achievement: be able to apply the knowledge of the devices operation principles and systems of micro and nano-system equipment in their operation design and operation. To know and understand the physical and chemical laws and phenomena underlying the technological processes of the course, to have knowledge of methods and means of controlling their parameters. To study the characteristics of technological processes, parameters of materials and devices of micro and nanosystem technology, taking into account the research goals, requirements and specifics of the selected technical means. Skills in using information and communication technologies to process measurement results.
Required prior and related subjects: Prerequisites: – Higher mathematics part 1, 2, 3; – Physics part 1, 2, 3; – Engineering programming.
Summary of the subject: The educational discipline covers the most common methods and means of measurement in the field of micro and nanosystem technology, studying the structure and principle of operation of measuring devices, processing and presenting the obtained results, achieving the required accuracy, the basics of standardization, certification and quality improvement .
Assessment methods and criteria: Evaluation methods and criteria: - current assessment (written reports on laboratory work, oral survey), 30%; - exam (written and oral form), 70%.
Recommended books: 1. Dorozhovets M., Motalo V., Stadnyk B. and others. Basics of metrology and measuring technology. In 2 volumes. – Lviv: Lviv Polytechnic University Publishing House. - 2005. V.1 - 532p. V.2 - 656 p. 2. Bychkivskyi R.V., Stolyarchuk P.G., Gamula P.R. Metrology, standardization, quality management and certification: — Lviv: Publishing House of the National University of Lviv Polytechnic, 2002. – 560 p.

Metrology, Standardization and Certification

Major: Micro and Nanosystem Technology
Code of subject: 6.153.00.O.013
Credits: 6.00
Department: Department of Electronic Engineering
Lecturer: DrSc., Prof. Voroniak Taras Ivanovych
Semester: 2 семестр
Mode of study: денна
Learning outcomes: As a result of the module studying students should: • to know basic methods for electric and nonelectric value measurements; • to know methods for processing and presenting measurement results; • to know structure and principles of operation of measurement devices; • to know basic standards in the sphere of electronics, automation and instrument engineering; • be able to calculate the value of physical values from the measurement results; • be able to calculate errors of results of direct and indirect measurements.
Required prior and related subjects: • mathematical analysis, • theory of probability, • theory of electric circuits.
Summary of the subject: Terminology and standardization of measurement methods and means. Systems of physical units, standards of units. Measurement errors. The methods for processing the measurement results and evaluation of their reliability and accuracy. Metrological characteristics of measuring instruments, metrological characteristic normalizations. State metrological control and supervision. Instruments and devices for measuring electric and magnetic values. Methods and tools for measuring nonelectrical values.
Assessment methods and criteria: • current control (30%): written reports on laboratory works, oral examination; • final control (70%): control measure, examination (written-oral form).
Recommended books: 1. Dorozhovets M., Motalo V., Stadnyk B. et al. The basics of metrology and measuring equipment. In 2 vol. – Lviv: NU "Lviv politechnique". – 2005. Vol.1 – 532 p. Vol.2 – 656 p. 2. Bychkivsky R.V., Stolyarchuk P.G., Gamula P.R. Metrology, standardization, quality measurement and certification. – Lviv: Lviv Polytechnic Publishing House. – 2002. – 560 p.